Highly Linear Mixer for On-Chip RF Test in 130nm CMOS

The complexity of wireless communication integrated circuits is increasing day by day due to the trend of multifunction and multistandard support. This has not only increased the production cost of these RFICs but the testing cost is also increased significantly, as much advanced test equipments and instruments are needed to carry out the sophisticated performance tests. To avoid this higher cost and to reduce the test time, the alternative is to perform on-chip test. .In RF transceivers, loopback is an on-chip test technique in which Tx signal, instead of radiating through antenna is fed to the Rx chain through a test attenuator (TA) during the test mode. A highly linear offset mixer is needed to implement this on-chip loopback test for these transceivers. The aim of this thesis work is to design a highly linear upconversion offset mixer for loopback test in CMOS technology. This mixer is designed for Bluetooth and GSM/EDGE standards. Few highly linear mixer architectures were simulated in 0.35um AMS process using Cadence SpectreRF software. When compared with active mixers, passive mixer consumes no dc power and there is significant reduction in silicon area overhead. The thesis presents a highly linear passive mixer with very low conversion loss and noise figure. The mixer is designed in 0.13um AMS CMOS process for higher cut off frequency and improved conversion loss. Pre and Post layout simulation results of the designed mixer are presented.